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Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope.
Scholl, A; Marcus, M A; Doran, A; Nasiatka, J R; Young, A T; MacDowell, A A; Streubel, R; Kent, N; Feng, J; Wan, W; Padmore, H A.
Afiliação
  • Scholl A; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA. Electronic address: a_scholl@lbl.gov.
  • Marcus MA; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Doran A; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Nasiatka JR; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Young AT; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • MacDowell AA; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Streubel R; Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Kent N; Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA; Department of Physics, University of California, Santa Cruz, Santa Cruz, CA 95064, USA.
  • Feng J; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Wan W; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
  • Padmore HA; Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley CA 94720, USA.
Ultramicroscopy ; 188: 77-84, 2018 05.
Article em En | MEDLINE | ID: mdl-29554489

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2018 Tipo de documento: Article