Cross-Plane Carrier Transport in Van der Waals Layered Materials.

Najmaei, Sina; Neupane, Mahesh R; Nichols, Barbara M; Burke, Robert A; Mazzoni, Alexander L; Chin, Matthew L; Rhodes, Daniel A; Balicas, Luis; Franklin, Aaron D; Dubey, Madan

Najmaei, Sina; Neupane, Mahesh R; Nichols, Barbara M; Burke, Robert A; Mazzoni, Alexander L; Chin, Matthew L; Rhodes, Daniel A; Balicas, Luis; Franklin, Aaron D; Dubey, Madan.

Afiliação

Najmaei S; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Neupane MR; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Nichols BM; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Burke RA; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Mazzoni AL; General Technical Services, LLC, 1451 Route 34 South-Suite 301, Wall Township, NJ, 07727, USA.
Chin ML; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Rhodes DA; Sensors and Electron Devices Directorate, United States Army Research Laboratory, 2800 Powder Mill Road, Adelphi, MD, 20783, USA.
Balicas L; National High Magnetic Field Laboratory, Florida State University, 1800 E. Paul Dirac Drive, Tallahassee, FL, 32310, USA.
Franklin AD; National High Magnetic Field Laboratory, Florida State University, 1800 E. Paul Dirac Drive, Tallahassee, FL, 32310, USA.
Dubey M; Department of Electrical and Computer Engineering, Duke University, Durham, NC, 27708, USA.

Small ; 14(20): e1703808, 2018 May.

Article em En | MEDLINE | ID: mdl-29659147

Palavras-chave

cross-plane electron transport; layered materials; transition metal dichalcogenides; tunneling; van der Waals gaps

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Small Assunto da revista: ENGENHARIA BIOMEDICA Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Estados Unidos

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