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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction.
Marciszko, Marianna; Baczmanski, Andrzej; Klaus, Manuela; Genzel, Christoph; Oponowicz, Adrian; Wronski, Sebastian; Wróbel, Miroslaw; Braham, Chedly; Sidhom, Habib; Wawszczak, Roman.
Afiliação
  • Marciszko M; AGH University of Science and Technology, ACMIN, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
  • Baczmanski A; AGH University of Science and Technology, WFiIS, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
  • Klaus M; Abteilung für Mikrostruktur- und Eigenspannungsanalyse, Helmholtz-Zentrum Berlin für Materialien und Energie, Albert-Einstein-Strasse 15, 12489 Berlin, Germany.
  • Genzel C; Abteilung für Mikrostruktur- und Eigenspannungsanalyse, Helmholtz-Zentrum Berlin für Materialien und Energie, Albert-Einstein-Strasse 15, 12489 Berlin, Germany.
  • Oponowicz A; AGH University of Science and Technology, WFiIS, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
  • Wronski S; AGH University of Science and Technology, WFiIS, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
  • Wróbel M; AGH University of Science and Technology, WIMiIP, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
  • Braham C; Arts et Métiers ParisTech (ENSAM), PIMM, 151 Boulevard de l'Hôpital, 75013 Paris, France.
  • Sidhom H; Université de Tunis, Laboratoire de Mécanique, Matériaux et Procédés, LAB-STI-03 ESSTT, 5 Avenue Taha Husseïn BP 56, Bab Menara, 1008 Tunis, Tunisia.
  • Wawszczak R; AGH University of Science and Technology, WFiIS, Aleja Mickiewicza 30, 30-059 Kraków, Poland.
J Appl Crystallogr ; 51(Pt 3): 732-745, 2018 Jun 01.
Article em En | MEDLINE | ID: mdl-29896059

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: J Appl Crystallogr Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Polônia

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: J Appl Crystallogr Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Polônia