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Native Point Defect Measurement and Manipulation in ZnO Nanostructures.
Brillson, Leonard; Cox, Jonathan; Gao, Hantian; Foster, Geoffrey; Ruane, William; Jarjour, Alexander; Allen, Martin; Look, David; von Wenckstern, Holger; Grundmann, Marius.
Afiliação
  • Brillson L; Department of Physics and Department of Electrical & Computer Engineering, The Ohio State University, Columbus, OH 43210, USA. brillson.1@osu.edu.
  • Cox J; Department of Physics, The Ohio State University, Columbus, OH 43210, USA.
  • Gao H; Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210, USA.
  • Foster G; Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210, USA.
  • Ruane W; Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210, USA.
  • Jarjour A; Department of Physics, Cornell University, Ithaca, NY 14853, USA.
  • Allen M; Department of Electrical and Computer Engineering, University of Canterbury, Christchurch 8140, New Zealand.
  • Look D; Air Force Research Laboratory, Sensors Directorate, WPAFB, OH 45433, USA.
  • von Wenckstern H; Semiconductor Research Center, Wright State University, Dayton, OH 45435, USA.
  • Grundmann M; Institut für Experimentelle Physik II, Universität Leipzig, Linnéstr. 5, 04103 Leipzig, Germany.
Materials (Basel) ; 12(14)2019 Jul 12.
Article em En | MEDLINE | ID: mdl-31336831
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Materials (Basel) Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Materials (Basel) Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Estados Unidos