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Quantify point defects in monolayer tungsten diselenide.
Ding, Sujuan; Lin, Fang; Jin, Chuanhong.
Afiliação
  • Ding S; Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan, Hunan 411105, People's Republic of China.
  • Lin F; State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, People's Republic of China.
  • Jin C; College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong 510642, People's Republic of China.
Nanotechnology ; 32(25)2021 Mar 31.
Article em En | MEDLINE | ID: mdl-33721843
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2021 Tipo de documento: Article
Texto completo
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PubMed Links
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nanotechnology Ano de publicação: 2021 Tipo de documento: Article