Excess Heat Capacity in Mo/Au Transition Edge Sensor Bolometric Detectors.

Brown, A D; Brekosky, R P; Colazo-Petit, F; Greenhouse, M A; Hays-Wehle, J P; Kutyrev, A S; Mikula, V; Rostem, K; Wollack, E J; Moseley, S H

Brown, A D; Brekosky, R P; Colazo-Petit, F; Greenhouse, M A; Hays-Wehle, J P; Kutyrev, A S; Mikula, V; Rostem, K; Wollack, E J; Moseley, S H.

Afiliação

Brown AD; NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA.
Brekosky RP; SSAI, Lanham, MD 20706 USA.; NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA.
Colazo-Petit F; Teltrium Solutions, LLC, Rockville, MD 20852 USA.
Greenhouse MA; NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA.
Hays-Wehle JP; University of Maryland, Baltimore County, Baltimore, MD 21250 USA.
Kutyrev AS; University of Maryland, College Park, College Park, MD 20742, USA.
Mikula V; American University, Washington, DC 20016 USA.
Rostem K; University of Maryland, Baltimore County, Baltimore, MD 21250 USA.
Wollack EJ; NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA.
Moseley SH; NASA Goddard Space Flight Center, Greenbelt, MD 20771, USA; Quantum Circuits, Inc., New Haven, CT 06511, USA.

IEEE Trans Appl Supercond ; 31(5)2021 Aug.

Article em En | MEDLINE | ID: mdl-33967568

Palavras-chave

Microfabrication; superconducting photodetectors; surface contamination; thin film sensors

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: IEEE Trans Appl Supercond Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Estados Unidos

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