Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements of Bilayer and Trilayer 2D Materials.

Zachman, Michael J; Madsen, Jacob; Zhang, Xiang; Ajayan, Pulickel M; Susi, Toma; Chi, Miaofang

Zachman, Michael J; Madsen, Jacob; Zhang, Xiang; Ajayan, Pulickel M; Susi, Toma; Chi, Miaofang.

Afiliação

Zachman MJ; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
Madsen J; Faculty of Physics, University of Vienna, Boltzmanngasse 5, Vienna, 1090, Austria.
Zhang X; Department of Materials Science and NanoEngineering, Rice University, Houston, TX, 77005, USA.
Ajayan PM; Department of Materials Science and NanoEngineering, Rice University, Houston, TX, 77005, USA.
Susi T; Faculty of Physics, University of Vienna, Boltzmanngasse 5, Vienna, 1090, Austria.
Chi M; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.

Small ; 17(28): e2100388, 2021 Jul.

Article em En | MEDLINE | ID: mdl-34080781

Palavras-chave

2D materials; 4D-STEM; Bragg interference; interlayer spacing; structural distortions

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Small Assunto da revista: ENGENHARIA BIOMEDICA Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Estados Unidos

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