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A New Total Uncertainty Measure from A Perspective of Maximum Entropy Requirement.
Zhang, Yu; Huang, Fanghui; Deng, Xinyang; Jiang, Wen.
Afiliação
  • Zhang Y; School of Electronics And Information, Northwestern Polytechnical University, Xi'an 710072, China.
  • Huang F; School of Electronics And Information, Northwestern Polytechnical University, Xi'an 710072, China.
  • Deng X; School of Electronics And Information, Northwestern Polytechnical University, Xi'an 710072, China.
  • Jiang W; School of Electronics And Information, Northwestern Polytechnical University, Xi'an 710072, China.
Entropy (Basel) ; 23(8)2021 Aug 17.
Article em En | MEDLINE | ID: mdl-34441201
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Entropy (Basel) Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Entropy (Basel) Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China