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The Deformation Behavior and Bending Emissions of ZnO Microwire Affected by Deformation-Induced Defects and Thermal Tunneling Effect.
Shi, Linlin; Wang, Hong; Ma, Xiaohui; Wang, Yunpeng; Wang, Fei; Zhao, Dongxu; Shen, Dezhen.
Afiliação
  • Shi L; State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, No. 7186 Wei-Xing Road, Changchun 130022, China.
  • Wang H; State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, No. 7186 Wei-Xing Road, Changchun 130022, China.
  • Ma X; State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, No. 7186 Wei-Xing Road, Changchun 130022, China.
  • Wang Y; State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, No. 3888 Dongnanhu Road, Changchun 130033, China.
  • Wang F; State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, No. 3888 Dongnanhu Road, Changchun 130033, China.
  • Zhao D; State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, No. 3888 Dongnanhu Road, Changchun 130033, China.
  • Shen D; State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, No. 3888 Dongnanhu Road, Changchun 130033, China.
Sensors (Basel) ; 21(17)2021 Sep 01.
Article em En | MEDLINE | ID: mdl-34502777
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China