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High-Yield Deterministic Focused Ion Beam Implantation of Quantum Defects Enabled by In Situ Photoluminescence Feedback.
Chandrasekaran, Vigneshwaran; Titze, Michael; Flores, Anthony R; Campbell, Deanna; Henshaw, Jacob; Jones, Andrew C; Bielejec, Edward S; Htoon, Han.
Afiliação
  • Chandrasekaran V; Center for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
  • Titze M; Sandia National Laboratories, Albuquerque, NM, 87123, USA.
  • Flores AR; Sandia National Laboratories, Albuquerque, NM, 87123, USA.
  • Campbell D; Sandia National Laboratories, Albuquerque, NM, 87123, USA.
  • Henshaw J; Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, NM, 87123, USA.
  • Jones AC; Center for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
  • Bielejec ES; Sandia National Laboratories, Albuquerque, NM, 87123, USA.
  • Htoon H; Center for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Adv Sci (Weinh) ; 10(18): e2300190, 2023 Jun.
Article em En | MEDLINE | ID: mdl-37088736

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Fótons / Eletrônica Idioma: En Revista: Adv Sci (Weinh) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo: 1 Base de dados: MEDLINE Assunto principal: Fótons / Eletrônica Idioma: En Revista: Adv Sci (Weinh) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos