Your browser doesn't support javascript.
loading
Ambipolar Thickness-Dependent Thermoelectric Measurements of WSe2.
Chen, Victoria; Lee, Hye Ryoung; Köroglu, Çagil; McClellan, Connor J; Daus, Alwin; Pop, Eric.
Afiliação
  • Chen V; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Lee HR; Geballe Laboratory for Advanced Materials, Stanford University, Stanford, California 94305, United States.
  • Köroglu Ç; Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States.
  • McClellan CJ; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Daus A; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Pop E; Dept. of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
Nano Lett ; 23(10): 4095-4100, 2023 May 24.
Article em En | MEDLINE | ID: mdl-37141159
Palavras-chave
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos