Unconventional polarization fatigue in van der Waals layered ferroelectric ionic conductor CuInP<sub>2</sub>S<sub>6</sub>.

Zhou, Ziwen; Wang, Shun; Zhou, Zhou; Hu, Yiqi; Li, Qiankun; Xue, Jinshuo; Feng, Zhijian; Yan, Qingyu; Luo, Zhongshen; Weng, Yuyan; Tang, Rujun; Su, Xiaodong; Zheng, Fengang; Okamoto, Kazuki; Funakubo, Hiroshi; Kang, Lixing; Fang, Liang; You, Lu

Unconventional polarization fatigue in van der Waals layered ferroelectric ionic conductor CuInP₂S₆.

Zhou, Ziwen; Wang, Shun; Zhou, Zhou; Hu, Yiqi; Li, Qiankun; Xue, Jinshuo; Feng, Zhijian; Yan, Qingyu; Luo, Zhongshen; Weng, Yuyan; Tang, Rujun; Su, Xiaodong; Zheng, Fengang; Okamoto, Kazuki; Funakubo, Hiroshi; Kang, Lixing; Fang, Liang; You, Lu.

Afiliação

Zhou Z; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Wang S; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Zhou Z; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Hu Y; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Li Q; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Xue J; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Feng Z; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Yan Q; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Luo Z; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Weng Y; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China. wengyuyan@suda.edu.cn.
Tang R; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Su X; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Zheng F; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China.
Okamoto K; School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama, 226-8502, Japan.
Funakubo H; School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama, 226-8502, Japan.
Kang L; Division of Advanced Materials, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, 215123, China.
Fang L; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China. lfang@suda.edu.cn.
You L; School of Physical Science and Technology, Jiangsu Key Laboratory of Thin Films, Soochow University, Suzhou, 215006, China. lyou@suda.edu.cn.

Nat Commun ; 14(1): 8254, 2023 Dec 12.

Article em En | MEDLINE | ID: mdl-38086809

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China

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