Offcut Substrate-Induced Defect Trapping at Step Edges.
Nano Lett
; 24(18): 5556-5561, 2024 May 08.
Article
em En
| MEDLINE
| ID: mdl-38668651
ABSTRACT
We report step edge-induced localized defects suppressing subsequent antiphase boundary formation in the bulk structure of a trilayer oxide heterostructure. The heterostructure encompasses a layer of La0.66Sr0.34MnO3 sandwiched between a superconducting La1.84Sr0.16CuO4 bottom layer and an insulating La2CuO4 top layer. The combination of a minor a-axis mismatch (0.11 Å) and a pronounced c-axis mismatch (2.73 Å) at the step edges leads to the emergence of localized defects exclusively forming at the step edge. Employing atomically resolved electron energy-loss spectroscopy maps, we discern the electronic state of those structures in the second La0.66Sr0.34MnO3 unit cell near the step edge. In particular, a reduction in the pre-edge region of the O-K edge indicates the formation of oxygen vacancies induced by the strained step edge. This study underscores our capability to control defects at the nanoscale.
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Base de dados:
MEDLINE
Idioma:
En
Revista:
Nano Lett
/
Nano lett
/
Nano letters
Ano de publicação:
2024
Tipo de documento:
Article
País de afiliação:
Alemanha