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Anisotropic Growth and Scanning Tunneling Microscopy Identification of Ultrathin Even-Layered PdSe2 Ribbons.
Jiang, Shaolong; Xie, Chunyu; Gu, Yue; Zhang, Qinghua; Wu, Xianxin; Sun, Yilin; Li, Wei; Shi, Yuping; Zhao, Liyun; Pan, Shuangyuan; Yang, Pengfei; Huan, Yahuan; Xie, Dan; Zhang, Qing; Liu, Xinfeng; Zou, Xiaolong; Gu, Lin; Zhang, Yanfeng.
Afiliação
  • Jiang S; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Xie C; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Gu Y; Shenzhen Geim Graphene Center and Low-Dimensional Materials and Devices Laboratory, Tsinghua-Berkeley Shenzhen Institute (TBSI), Tsinghua University, Shenzhen, 518055, P. R. China.
  • Zhang Q; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
  • Wu X; School of Physical Sciences, University of Chinese Academy of Sciences, Beijing, 100049, P. R. China.
  • Sun Y; Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, P. R. China.
  • Li W; Institute of Microelectronics, Tsinghua National Laboratory for Information Science and Technology (TNList), Tsinghua University, Beijing, 100084, P. R. China.
  • Shi Y; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Zhao L; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Pan S; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Yang P; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Huan Y; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Xie D; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Zhang Q; Institute of Microelectronics, Tsinghua National Laboratory for Information Science and Technology (TNList), Tsinghua University, Beijing, 100084, P. R. China.
  • Liu X; Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, P. R. China.
  • Zou X; Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, P. R. China.
  • Gu L; Shenzhen Geim Graphene Center and Low-Dimensional Materials and Devices Laboratory, Tsinghua-Berkeley Shenzhen Institute (TBSI), Tsinghua University, Shenzhen, 518055, P. R. China.
  • Zhang Y; Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100190, P. R. China.
Small ; 15(45): e1902789, 2019 Nov.
Article em En | MEDLINE | ID: mdl-31544354
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Small Assunto da revista: ENGENHARIA BIOMEDICA Ano de publicação: 2019 Tipo de documento: Article
Texto completo
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PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Small Assunto da revista: ENGENHARIA BIOMEDICA Ano de publicação: 2019 Tipo de documento: Article