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Study on Method for Measuring Coating Emissivity by Applying Active Irradiation Based on Infrared Thermal Imager.
Li, Yiwen; Zhang, Puyousen; Chen, Ge; Li, Yao; Hua, Weizhuo; Li, Yuqin; Jiao, Zhaoqiang.
Afiliação
  • Li Y; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Zhang P; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Chen G; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Li Y; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Hua W; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Li Y; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
  • Jiao Z; Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.
Sensors (Basel) ; 22(6)2022 Mar 20.
Article em En | MEDLINE | ID: mdl-35336563
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China