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Time-Resolved Structural Measurement of Thermal Resistance across a Buried Semiconductor Heterostructure Interface.
Lee, Joohyun; Jo, Wonhyuk; Kwon, Ji-Hwan; Griffin, Bruce; Cho, Byeong-Gwan; Landahl, Eric C; Lee, Sooheyong.
Afiliação
  • Lee J; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
  • Jo W; European X-ray Free-Electron Laser GmbH, 22869 Schenefeld, Germany.
  • Kwon JH; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
  • Griffin B; Department of Nano Convergence Measurement, Korea University of Science and Technology, Daejeon 305-340, Republic of Korea.
  • Cho BG; Department of Physics and Astrophysics, DePaul University, Chicago, IL 60614, USA.
  • Landahl EC; Korea Research Institute of Standards and Science, Daejeon 34113, Republic of Korea.
  • Lee S; Department of Physics and Astrophysics, DePaul University, Chicago, IL 60614, USA.
Materials (Basel) ; 16(23)2023 Nov 30.
Article em En | MEDLINE | ID: mdl-38068194
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Materials (Basel) Ano de publicação: 2023 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Revista: Materials (Basel) Ano de publicação: 2023 Tipo de documento: Article