Bringing metasurfaces to analytical lens design: stigmatism and specific ray mapping.

We propose a method to design the exact phase profile of at least one metasurface in a stigmatic singlet that can be made to implement a desired ray mapping. Following the generalized vector law of refraction and Fermat's principle, we can obtain exact solutions for the required lens shape and phase profile of a phase gradient metasurface to respect particular ray conditions (e.g., Abbe sine) as if it were a freeform refractive element. To do so, the method requires solving an implicit ordinary differential equation. We present comparisons with Zemax simulations of illustrative designed lenses to confirm the anticipated optical behaviour.

On the diffraction of a high-NA aplanatic and stigmatic singlet.

We present a study of the diffraction pattern according to Richards-Wolf for an aplanatic and stigmatic singlet based on an exact analytical equation. We are able to put emphasis on the maximum diameter and illumination pattern, which are the two parameters that influence the diffraction pattern and how to compute it. Designs of low- and high-NA aplanatic and stigmatic lenses are implemented to display these effects.

Toric lens analysis as a focal ring and Bessel beam generator.

We propose an analytical solution of the focal ring generated at the focus of a toric lens. The analytical field of the focal ring is used with a Fourier transform lens to generate a Bessel beam. A comparative analysis between the use of an illuminated annular aperture, an axicon, and a toric lens to generate a Bessel beam is performed, and the benefits and drawbacks of each are discussed. This highlights the advantages of using a toric lens with a Gaussian beam to produce a focal line of increasing intensity, which is advantageous for applications such as high depth-of-field microscopy.

Analytical inversion of the focusing of high-numerical-aperture aplanatic systems.

We propose a method for an analytical inversion of the electric and magnetic fields at the focus of a high-NA aplanatic system to obtain incident light beam distribution. Our approach is based on an inverse Fourier transform of the Richards-Wolf formalism for targeted longitudinal fields along the radial or axial directions at the non-paraxial focus. Analytical solutions are discussed for both axial and radial focal fields for a radially polarized incident light beam, and a criterion is defined to access a physically valid solution. We also validate the method according to results found in the literature. Finally, we show how the method can be generalized to other incident field distributions.