Synthesis and Characterization of Multilayered CrAlN/Al2O3 Tandem Coating Using HiPIMS for Solar Selective Applications at High Temperature.

The effect of applying a negative bias during deposition of a previously designed multilayer solar selective absorber coating was studied on two types of substrates (316L stainless steel and Inconel 625). The solar selective coating is composed of different chromium aluminum nitride layers deposited using a combination of radiofrequency (RF), direct current (DC), and high-power impulse magnetron sputtering (HiPIMS) technologies. The chemical composition is varied to generate an infrared reflective/absorber layer (with low Al addition and N vacancies) and two CrAlN intermediate layers with medium and high aluminum content (Al/Cr = 0.6 and 1.2). A top aluminum oxide layer (Al2O3) is deposited as an antireflective layer. In this work, a simultaneous DC-pulsed bias (-100 V, 250 kHz) was applied to the substrates in order to increase the film density. The optical performance, thermal stability, and oxidation resistance was evaluated and compared with the performance obtained with similar unbiased coating and a commercial Pyromark paint reference at 600, 700, and 800 °C. The coating remained stable after 200 h of annealing at 600 °C, with solar absorptance (α) values of 93% and 92% for samples deposited on stainless steel and Inconel, respectively, and a thermal emittance ε25°C of 18%. The introduction of additional ion bombardment during film growth through bias assistance resulted in increased durability, thermal stability, and working temperature limits compared with unbiased coatings. The solar-to-mechanical energy conversion efficiency at 800 °C was found to be up to 2 times higher than Pyromark at C = 100 and comparable at C = 1000.

Synthesis and Characterisation of ASA-PEEK Composites for Fused Filament Fabrication.

In this paper, a series of polymer composites made from acrylonitrile-styrene-acrylate (ASA) and poly (ether ether ketone) (PEEK) were manufactured. ASA acts as a polymer matrix while PEEK is loaded in the form of micro-particles that act as a reinforcing filler. The composites were compounded by single screw extrusion and then, different specimens were manufactured either via injection moulding (IM) or fused filament fabrication (FFF). Two different types of PEEK (commercial and reused) in different concentrations (3 and 6 wt.%) were tested and their influence in the mechanical, structural, and thermal properties were studied. It was observed that reused PEEK enhanced the stiffness and tensile strength and thermal stability of the composites both, for injected and printed specimens. This evidences the suitability of these composites as potential candidates as novel materials with enhanced properties following an approach of circular economy.

Cluster Tool for In Situ Processing and Comprehensive Characterization of Thin Films at High Temperatures.

A new cluster tool for in situ real-time processing and depth-resolved compositional, structural and optical characterization of thin films at temperatures from -100 to 800 °C is described. The implemented techniques comprise magnetron sputtering, ion irradiation, Rutherford backscattering spectrometry, Raman spectroscopy, and spectroscopic ellipsometry. The capability of the cluster tool is demonstrated for a layer stack MgO/amorphous Si (∼60 nm)/Ag (∼30 nm), deposited at room temperature and crystallized with partial layer exchange by heating up to 650 °C. Its initial and final composition, stacking order, and structure were monitored in situ in real time and a reaction progress was defined as a function of time and temperature.

Formation of antireflection Zn/ZnO core-shell nano-pyramidal arrays by O2+ ion bombardment of Zn surfaces.

ZnO is probably one of the most studied oxides since ZnO nanostructures are a very rich family of nanomaterials with a broad variety of technological applications. Although several chemical techniques offer the possibility to obtain such ZnO nanostructures, here we show that the controlled modification of the zinc surface by low-energy O2+ bombardment leads to the formation of core-shell Zn/ZnO nano-pyramidal arrays that suppress the reflection of light decreasing the reflectivity below 6% in the wavelength range of 300-900 nm. This controlled and scalable protocol opens the door to a broad range of possibilities for the use of ion bombardment to produce surface modifications for technological applications in the field of photoelectric devices and solar cells.

Towards nanometric resolution in multilayer depth profiling: a comparative study of RBS, SIMS, XPS and GDOES.

An increasing amount of effort is currently being directed towards the development of new functionalized nanostructured materials (i.e., multilayers and nanocomposites). Using an appropriate combination of composition and microstructure, it is possible to optimize and tailor the final properties of the material to its final application. The analytical characterization of these new complex nanostructures requires high-resolution analytical techniques that are able to provide information about surface and depth composition at the nanometric level. In this work, we comparatively review the state of the art in four different depth-profiling characterization techniques: Rutherford backscattering spectroscopy (RBS), secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS) and glow discharge optical emission spectroscopy (GDOES). In addition, we predict future trends in these techniques regarding improvements in their depth resolutions. Subnanometric resolution can now be achieved in RBS using magnetic spectrometry systems. In SIMS, the use of rotating sample holders and oxygen flooding during analysis as well as the optimization of floating low-energy ion guns to lower the impact energy of the primary ions improves the depth resolution of the technique. Angle-resolved XPS provides a very powerful and nondestructive technique for obtaining depth profiling and chemical information within the range of a few monolayers. Finally, the application of mathematical tools (deconvolution algorithms and a depth-profiling model), pulsed sources and surface plasma cleaning procedures is expected to greatly improve GDOES depth resolution.