RESUMO
Since the discovery of the Phillips catalysts, there still is much uncertainty concerning their activation, their molecular structure, the nature of the active chromium sites, and the polymerization mechanisms. Surface techniques are not easy to be used for such study according to the nonconductive behavior of the support. Therefore, model Phillips catalyst is elaborated by spin coating a trivalent chromium precursor on a silicon wafer. The surface characterization of this model catalyst is conducted by laser ablation mass spectrometry (LA-MS), laser desorption/ionization mass spectrometry (LDI-MS), and static secondary ion mass spectrometry (s-SIMS), at different steps of its preparation. To validate our approach, a comparison is also made between the model and the real Philips catalyst. Moreover, the model catalyst efficiency for polyethylene synthesis is evaluated and allows us to discuss the validity of the mechanisms previously proposed to explain the catalytic process. The characterization of Phillips model catalyst by mass spectrometry allows us to better understand the activation processes of such catalyst. Depending on the activation temperature, chromium oxide species are formed and anchored at the support surface. They consist mainly in mono-chromium sites at high temperature. The chromium valence is hexavalent. This model catalyst is active for the polymerization of ethylene. A pseudo-oligomer molecular weight distribution is observed by LA-MS, whereas s-SIMS allows us to elucidate the anchorage of the polymer at activate chromium surface sites.
Assuntos
Cromo/química , Polietileno/análise , Polietileno/química , Espectrometria de Massas por Ionização por Electrospray/métodos , Espectrometria de Massas por Ionização e Dessorção a Laser Assistida por Matriz/métodos , Catálise , LasersRESUMO
A model Phillips catalyst for ethylene polymerization, prepared by spin coating a Cr(III)(Cr(acac)3) precursor on a silicon wafer, was submitted to an oxidative activation. Laser ablation Fourier transform mass spectrometry provided direct information on molecular species at the silicon wafer surface during activation. At 350 degrees C the chromium precursor was degraded, while chromium oxide species were formed. The chromium concentration decreased with temperature. The activated model catalyst was active for ethylene polymerization. Using complementary techniques (Fourier transform infrared spectroscopy, laser desorption/ionization mass spectrometry), the polymer was identified as crystalline polyethylene. After 1 h of polymerization at 160 degrees C, dome-like structures were observed by atomic force microscopy. Their morphologies were constituted of regions of parallel aligned lamellae of polymer.