RESUMO
We present that the tailored nanopatterning with tunable shape, depth, and dimension for diverse application-specific designs can be realized by utilizing controlled dynamic nanoinscribing (DNI), which can generate bur-free plastic deformation on various flexible substrates via continuous mechanical inscription of a small sliced edge of a nanopatterned mold in a compact and vacuum-free system. Systematic controlling of prime DNI processing parameters including inscribing force, temperature, and substrate feed rate can determine the nanopattern depths and their specific profiles from rounded to angular shapes as a summation of the force-driven plastic deformation and heat-driven thermal deformation. More complex nanopatterns with gradient depths and/or multidimensional profiles can also be readily created by modulating the horizontal mold edge alignment and/or combining sequential DNI strokes, which otherwise demand laborious and costly procedures. Many practical user-specific applications may benefit from this study by tailor-making the desired nanopattern structures within desired areas, including precision machine and optics components, transparent electronics and photonics, flexible sensors, and reattachable and wearable devices. We demonstrate one vivid example in which the light diffusion direction of a light-emitting diode can be tuned by application of specifically designed DNI nanopatterns.
RESUMO
A cost-effective solution-based synthesis route to grow MoSe2 thin films with vertically aligned atomic layers, thereby maximally exposing the edge sites on the film surface as well as enhancing charge transport to the electrode, is demonstrated for hydrogen evolution reaction. The surface morphologies of thin films are investigated by scanning electron microscopy and atomic force microscopy, and transmission electron microscopy analyses confirm the formation of the vertically aligned layered structure of MoSe2 in those films, with supporting evidences obtained by Raman. Additionally, their optical and compositional properties are investigated by photoluminescence and X-ray photoelectron spectroscopy, and their electrical properties are evaluated using bottom-gate field-effect transistors. The resultant pristine MoSe2 thin film exhibited low overpotential of 88 mV (at 10 mA·cm-2) and a noticeably high exchange current density of 0.845 mA·cm-2 with excellent stability, which is superior to most of other reported MoS2 or MoSe2-based catalysts, even without any other strategies such as doping, phase transformation, and integration with other materials.