RESUMO
The continuing effort to utilize the unique properties present in a number of strongly correlated transition metal oxides for novel device applications has led to intense study of their transitional phase state behavior. Here we report on time-resolved coherent X-ray diffraction measurements on a single vanadium dioxide nanocrystal undergoing a solid-solid phase transition, using the SACLA X-ray Free Electron Laser (XFEL) facility. We observe an ultrafast transition from monoclinic to tetragonal crystal structure in a single vanadium dioxide nanocrystal. Our findings demonstrate that the structural change occurs in a number of distinct stages attributed to differing expansion modes of vanadium atom pairs.
RESUMO
A metre-length flexible hollow glass fibre with 20â µm-bore and 1.5â mm-cladding diameters for transporting a synchrotron X-ray beam and controlling the trajectory has been examined. The large cladding diameter maintains a moderate curvature to satisfy the shallow glancing angle of total reflection. The observed transmission efficiency was more than 20% at 12.4â keV. As a demonstration, a wide-area scan of a synchrotron radiation beam was performed to identify the elements for a fixed metal film through its absorption spectra.
RESUMO
X-ray reflectivity measurements of the glass transition in thin polystyrene films supported on Si substrates were performed at slow cooling rates ranging from 0.62 to 0.01 (°)C/min. At a cooling rate of 0.14 (°)C/min, a depression in the glass transition temperature Tg was clearly observed with decreasing thickness. However, at a cooling rate of 0.62 (°)C/min, only a slight decrease in Tg for a 12-nm-thick film was observed, while at an ultraslow cooling rate of 0.01 °C/min, a significant reduction in the Tg of ultrathin films (12 and 6 nm) was observed. As the thickness decreased, a broadening in the width of the glass transition, w, was found at higher cooling rates (0.62 °C/min and 0.14 °C/min), while narrowing of w was observed at ultraslow cooling rates of 0.01 °C/min and 0.04 °C/min. A narrow distribution of relaxation time in the ultrathin films indicates that most segments are able to relax under the ultraslow cooling process, thus showing an inherent reduction in the Tg of the confined thin polymer films.