RESUMO
The frequency-resolved terahertz (THz) beam profile characteristics of a two-color air-plasma THz source were investigated in the broadband frequency range (1-15 THz). The frequency resolution is achieved by combining THz waveform measurements and the knife-edge technique. Our results show that the THz focal spot size is strongly frequency dependent. This has important implications on nonlinear THz spectroscopy applications where accurate knowledge of the applied THz electrical field strength onto the sample is important. In addition, the transition between the solid and hollow beam profile of the air-plasma THz beam was carefully identified. Far from the focus, the features across the 1-15 THz range have also been carefully examined, revealing the characteristic conical emission patterns at all frequencies.
RESUMO
We demonstrate that the conductivity of graphene on thin-film polymer substrates can be accurately determined by reflection-mode air-plasma-based THz time-domain spectroscopy (THz-TDS). The phase uncertainty issue associated with reflection measurements is discussed, and our implementation is validated by convincing agreement with graphene electrical properties extracted from more conventional transmission-mode measurements. Both the reflection and transmission THz-TDS measurements reveal strong non-linear and instantaneous conductivity depletion across an ultra-broad bandwidth (1-9 THz) under relatively high incident THz electrical field strengths (up to 1050 kV/cm).