Bi-Directional Ensemble Feature Reconstruction Network for Few-Shot Fine-Grained Classification.

The main challenge for fine-grained few-shot image classification is to learn feature representations with higher inter-class and lower intra-class variations, with a mere few labelled samples. Conventional few-shot learning methods however cannot be naively adopted for this fine-grained setting - a quick pilot study reveals that they in fact push for the opposite (i.e., lower inter-class variations and higher intra-class variations). To alleviate this problem, prior works predominately use a support set to reconstruct the query image and then utilize metric learning to determine its category. Upon careful inspection, we further reveal that such unidirectional reconstruction methods only help to increase inter-class variations and are not effective in tackling intra-class variations. In this paper, we introduce a bi-reconstruction mechanism that can simultaneously accommodate for inter-class and intra-class variations. In addition to using the support set to reconstruct the query set for increasing inter-class variations, we further use the query set to reconstruct the support set for reducing intra-class variations. This design effectively helps the model to explore more subtle and discriminative features which is key for the fine-grained problem in hand. Furthermore, we also construct a self-reconstruction module to work alongside the bi-directional module to make the features even more discriminative. We introduce the snapshot ensemble method in the episodic learning strategy - a simple trick to further improve model performance without increasing training costs. Experimental results on three widely used fine-grained image classification datasets, as well as general and cross-domain few-shot image datasets, consistently show considerable improvements compared with other methods. Codes are available at https://github.com/PRIS-CV/BiEN.

BSNet: Bi-Similarity Network for Few-shot Fine-grained Image Classification.

Few-shot learning for fine-grained image classification has gained recent attention in computer vision. Among the approaches for few-shot learning, due to the simplicity and effectiveness, metric-based methods are favorably state-of-the-art on many tasks. Most of the metric-based methods assume a single similarity measure and thus obtain a single feature space. However, if samples can simultaneously be well classified via two distinct similarity measures, the samples within a class can distribute more compactly in a smaller feature space, producing more discriminative feature maps. Motivated by this, we propose a so-called Bi-Similarity Network (BSNet) that consists of a single embedding module and a bi-similarity module of two similarity measures. After the support images and the query images pass through the convolution-based embedding module, the bi-similarity module learns feature maps according to two similarity measures of diverse characteristics. In this way, the model is enabled to learn more discriminative and less similarity-biased features from few shots of fine-grained images, such that the model generalization ability can be significantly improved. Through extensive experiments by slightly modifying established metric/similarity based networks, we show that the proposed approach produces a substantial improvement on several fine-grained image benchmark datasets. Codes are available at: https://github.com/PRIS-CV/BSNet.