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Atomically precise placement of single dopants in si.
Schofield, S R; Curson, N J; Simmons, M Y; Ruess, F J; Hallam, T; Oberbeck, L; Clark, R G.
Afiliação
  • Schofield SR; Centre for Quantum Computer Technology, School of Physics, University of New South Wales, Sydney, NSW 2052, Australia. steven@phys.unsw.edu.au
Phys Rev Lett ; 91(13): 136104, 2003 Sep 26.
Article em En | MEDLINE | ID: mdl-14525322
ABSTRACT
We demonstrate the controlled incorporation of P dopant atoms in Si(001), presenting a new path toward the creation of atomic-scale electronic devices. We present a detailed study of the interaction of PH3 with Si(001) and show that it is possible to thermally incorporate P atoms into Si(001) below the H-desorption temperature. Control over the precise spatial location at which P atoms are incorporated was achieved using STM H lithography. We demonstrate the positioning of single P atoms in Si with approximately 1 nm accuracy and the creation of nanometer wide lines of incorporated P atoms.
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Base de dados: MEDLINE Idioma: En Ano de publicação: 2003 Tipo de documento: Article
Buscar no Google
Base de dados: MEDLINE Idioma: En Ano de publicação: 2003 Tipo de documento: Article