Tetracene film morphology: comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations.
Eur Phys J E Soft Matter
; 27(4): 421-4, 2008 Dec.
Article
em En
| MEDLINE
| ID: mdl-19104858
ABSTRACT
X-ray diffraction, atomic force microscopy and spectroscopic ellipsometry were used to study tetracene thin films as a function of deposition rate. A comparative analysis of the thickness and roughness values allows for detailed modelling of the film morphology. An interdigitated growth mode is established for the coexisting thin film and bulk phases. By comparison with the respective quinone-derivative of tetracene, we were additionally able to identify reaction products by their optical response.
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MEDLINE
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En
Ano de publicação:
2008
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Article