Your browser doesn't support javascript.
loading
A 50 nm spatial resolution EUV imaging-resolution dependence on object thickness and illumination bandwidth.
Wachulak, Przemyslaw W; Bartnik, Andrzej; Fiedorowicz, Henryk; Kostecki, Jerzy.
Afiliação
  • Wachulak PW; Institute of Optoelectronics, Military University of Technology, ul. gen. S. Kaliskiego 2, 00-908 Warsaw, Poland. wachulak@gmail.com
Opt Express ; 19(10): 9541-50, 2011 May 09.
Article em En | MEDLINE | ID: mdl-21643212
In this paper we report a desk-top microscopy reaching 50 nm spatial resolution in very compact setup using a gas-puff laser plasma EUV source. The thickness of an object and the bandwidth of illuminating radiation were studied in order to estimate their quantitative influence on the EUV microscope spatial resolution. EUV images of various thickness objects obtained by illumination with variable bandwidth EUV radiation were compared in terms of knife-edge spatial resolution to study the bandwidth/object thickness parasitic influence on spatial resolution of the EUV microscope.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2011 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2011 Tipo de documento: Article