Dark-field X-ray microscopy for multiscale structural characterization.

Simons, H; King, A; Ludwig, W; Detlefs, C; Pantleon, W; Schmidt, S; Snigireva, I; Snigirev, A; Poulsen, H F.

Afiliação

Simons H; 1] Department of Physics, DTU, 2800 Kongens Lyngby, Denmark [2] ESRF, CS 40220, 38043 Grenoble Cedex 9, France.
King A; ESRF, CS 40220, 38043 Grenoble Cedex 9, France.
Ludwig W; MATEIS, INSA-Lyon, 69621 Villeurbanne Cedex, France.
Detlefs C; ESRF, CS 40220, 38043 Grenoble Cedex 9, France.
Pantleon W; Department of Mechanical Engineering, DTU, 2800 Kongens Lyngby, Denmark.
Schmidt S; Department of Physics, DTU, 2800 Kongens Lyngby, Denmark.
Snigireva I; ESRF, CS 40220, 38043 Grenoble Cedex 9, France.
Snigirev A; 1] ESRF, CS 40220, 38043 Grenoble Cedex 9, France [2] Immanuel Kant Baltic Federal University, Kaliningrad 236041, Russian Federation.
Poulsen HF; Department of Physics, DTU, 2800 Kongens Lyngby, Denmark.

Nat Commun ; 6: 6098, 2015 Jan 14.

Article em En | MEDLINE | ID: mdl-25586429

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article