Genome-Wide Analyses of Working-Memory Ability: A Review.

Knowles, E E M; Mathias, S R; McKay, D R; Sprooten, E; Blangero, John; Almasy, Laura; Glahn, D C.

Afiliação

Knowles EE; Department of Psychiatry, Yale University School of Medicine, New Haven, CT, USA; Olin Neuropsychiatric Research Center, Institute of Living, Hartford, Hospital, Hartford, CT, USA.
Mathias SR; Department of Psychiatry, Yale University School of Medicine, New Haven, CT, USA; Olin Neuropsychiatric Research Center, Institute of Living, Hartford, Hospital, Hartford, CT, USA.
McKay DR; Department of Psychiatry, Yale University School of Medicine, New Haven, CT, USA; Olin Neuropsychiatric Research Center, Institute of Living, Hartford, Hospital, Hartford, CT, USA.
Sprooten E; Department of Psychiatry, Yale University School of Medicine, New Haven, CT, USA; Olin Neuropsychiatric Research Center, Institute of Living, Hartford, Hospital, Hartford, CT, USA.
Blangero J; Department of Genetics, Texas Biomedical Research Institute, San Antonio, TX, USA.
Almasy L; Department of Genetics, Texas Biomedical Research Institute, San Antonio, TX, USA.
Glahn DC; Department of Psychiatry, Yale University School of Medicine, New Haven, CT, USA; Olin Neuropsychiatric Research Center, Institute of Living, Hartford, Hospital, Hartford, CT, USA.

Curr Behav Neurosci Rep ; 1(4): 224-233, 2014 Dec.

Article em En | MEDLINE | ID: mdl-25729637