Single-Molecule Surface-Enhanced Raman Scattering: Can STEM/EELS Image Electromagnetic Hot Spots?

Mirsaleh-Kohan, Nasrin; Iberi, Vighter; Simmons, Philip D; Bigelow, Nicholas W; Vaschillo, Alex; Rowland, Meng M; Best, Michael D; Pennycook, Stephen J; Masiello, David J; Guiton, Beth S; Camden, Jon P.

Afiliação

Mirsaleh-Kohan N; Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996, United States.
Iberi V; Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996, United States.
Simmons PD; Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996, United States.
Bigelow NW; Department of Chemistry, University of Washington, Seattle, Washington 98195, United States.
Vaschillo A; Department of Chemistry, University of Washington, Seattle, Washington 98195, United States.
Rowland MM; Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996, United States.
Best MD; Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996, United States.
Pennycook SJ; §Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
Masiello DJ; â¥Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996, United States.
Guiton BS; Department of Chemistry, University of Washington, Seattle, Washington 98195, United States.
Camden JP; §Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.