Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy.
Adv Mater
; 28(25): 5106-11, 2016 Jul.
Article
em En
| MEDLINE
| ID: mdl-27111855
ABSTRACT
A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.
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MEDLINE
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En
Ano de publicação:
2016
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Article