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Thermal conductivity of individual silicon nanoribbons.
Yang, Lin; Yang, Yang; Zhang, Qian; Zhang, Yin; Jiang, Youfei; Guan, Zhe; Gerboth, Matthew; Yang, Juekuan; Chen, Yunfei; Greg Walker, D; Xu, Terry T; Li, Deyu.
Afiliação
  • Yang L; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
  • Yang Y; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
  • Zhang Q; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
  • Zhang Y; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu and School of Mechanical Engineering and Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, Southeast University, Nanjing, 210096, P. R. China.
  • Jiang Y; Department of Mechanical Engineering and Engineering Science, The University of North Carolina at Charlotte, Charlotte, NC 28223, USA.
  • Guan Z; Department of Mechanical Engineering and Engineering Science, The University of North Carolina at Charlotte, Charlotte, NC 28223, USA.
  • Gerboth M; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
  • Yang J; School of Mechanical Engineering and Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, Southeast University, Nanjing, 210096, P. R. China.
  • Chen Y; School of Mechanical Engineering and Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, Southeast University, Nanjing, 210096, P. R. China.
  • Greg Walker D; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
  • Xu TT; Department of Mechanical Engineering and Engineering Science, The University of North Carolina at Charlotte, Charlotte, NC 28223, USA.
  • Li D; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN 37235, USA. deyu.li@vanderbilt.edu.
Nanoscale ; 8(41): 17895-17901, 2016 Oct 20.
Article em En | MEDLINE | ID: mdl-27722640
ABSTRACT
The thermal conductivities of two groups of silicon nanoribbons of ∼20 and ∼30 nm thickness and various widths have been measured and analyzed through combining the Callaway model and the Fuchs-Sondheimer (FS) reduction function. The results show that while the data for the ∼30 nm thick ribbons can be well-explained by the classical size effect, the measured thermal conductivities for the ∼20 nm thick ribbons deviate from the prediction remarkably, and size effects beyond phonon-boundary scattering must be considered. The measurements of the Young's modulus of the thin nanoribbons yield significantly lower values than the corresponding bulk value, which could lead to a reduced phonon group velocity and subsequently thermal conductivity. This study helps to build a regime map for thermal conductivity versus nanostructures' surface-area-to-volume ratio that clearly delineates two regions where size effects beyond the Casimir limit are important or not important.
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Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article
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Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article