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In-situ straining and time-resolved electron tomography data acquisition in a transmission electron microscope.
Hata, S; Miyazaki, S; Gondo, T; Kawamoto, K; Horii, N; Sato, K; Furukawa, H; Kudo, H; Miyazaki, H; Murayama, M.
Afiliação
  • Hata S; Department of Electrical and Materials Science and Engineering and The Ultramicroscopy Research Center, Kyushu University, 6-1 Kasugakoen, Kasuga-shi, Fukuoka 816-8580, Japan.
  • Miyazaki S; FEI Company Japan Ltd. (Currently, Materials and Structural Analysis, Thermo Fisher Scientific), 4-12-2 Higashi-Shinagawa, Shinagawa-ku, Tokyo 140-0002, Japan.
  • Gondo T; Mel-Build Corporation, 3-1-15, Shimoyamato, Nishi-ku, Fukuoka 819-0052, Japan.
  • Kawamoto K; Mel-Build Corporation, 3-1-15, Shimoyamato, Nishi-ku, Fukuoka 819-0052, Japan.
  • Horii N; Engineering Department, System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
  • Sato K; Engineering Department, System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
  • Furukawa H; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.
  • Kudo H; System in Frontier Inc., 2-8-3, Shinsuzuharu bldg. 4F, Akebono-cho, Tachikawa-shi, Tokyo 190-0012, Japan.
  • Miyazaki H; Faculty of Engineering, Information and Systems, University of Tsukuba, Tennoudai 1-1-1, Tsukuba 305-8573, Japan.
  • Murayama M; JST-ERATO, Momose Quantum-Beam Phase Imaging Project, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan.
Microscopy (Oxf) ; 66(2): 143-153, 2017 Apr 01.
Article em En | MEDLINE | ID: mdl-27993950

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article