Demonstration of Logic Operations in High-Performance RRAM Crossbar Array Fabricated by Atomic Layer Deposition Technique.

Han, Runze; Huang, Peng; Zhao, Yudi; Chen, Zhe; Liu, Lifeng; Liu, Xiaoyan; Kang, Jinfeng.

Afiliação

Han R; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Huang P; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Zhao Y; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Chen Z; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Liu L; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Liu X; Institute of Microelectronics, Peking University, Beijing, 100871, China.
Kang J; Institute of Microelectronics, Peking University, Beijing, 100871, China. kangjf@pku.edu.cn.

Nanoscale Res Lett ; 12(1): 37, 2017 Dec.

Article em En | MEDLINE | ID: mdl-28091948