Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions.

Zhong, Zhichao; Aveyard, Richard; Rieger, Bernd; Bals, Sara; Palenstijn, Willem Jan; Batenburg, K Joost.

Afiliação

Zhong Z; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands. Electronic address: zhong@cwi.nl.
Aveyard R; Department of Imaging Physics, Delft University of Technology, The Netherlands.
Rieger B; Department of Imaging Physics, Delft University of Technology, The Netherlands.
Bals S; EMAT, University of Antwerp, Antwerp, Belgium.
Palenstijn WJ; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands.
Batenburg KJ; Centrum Wiskunde & Informatica, Amsterdam, The Netherlands; Mathematical Institute, Universiteit Leiden, Leiden, The Netherlands.

Ultramicroscopy ; 184(Pt B): 57-65, 2018 01.

Article em En | MEDLINE | ID: mdl-29096395

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article