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Charge-Transfer-Induced p-Type Channel in MoS2 Flake Field Effect Transistors.
Min, Sung-Wook; Yoon, Minho; Yang, Sung Jin; Ko, Kyeong Rok; Im, Seongil.
Afiliação
  • Min SW; Institute of Physics and Applied Physics, Yonsei University , Seoul 120-749, Korea.
  • Yoon M; Institute of Physics and Applied Physics, Yonsei University , Seoul 120-749, Korea.
  • Yang SJ; Institute of Physics and Applied Physics, Yonsei University , Seoul 120-749, Korea.
  • Ko KR; Institute of Physics and Applied Physics, Yonsei University , Seoul 120-749, Korea.
  • Im S; Institute of Physics and Applied Physics, Yonsei University , Seoul 120-749, Korea.
ACS Appl Mater Interfaces ; 10(4): 4206-4212, 2018 Jan 31.
Article em En | MEDLINE | ID: mdl-29318882

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article