Probing the Ionic and Electrochemical Phenomena during Resistive Switching of NiO Thin Films.

Lu, Wanheng; Xiao, Juanxiu; Wong, Lai-Mun; Wang, Shijie; Zeng, Kaiyang

Lu, Wanheng; Xiao, Juanxiu; Wong, Lai-Mun; Wang, Shijie; Zeng, Kaiyang.

Afiliação

Lu W; Department of Mechanical Engineering , National University of Singapore , 9 Engineering Drive 1 , Singapore 117576.
Xiao J; Department of Mechanical Engineering , National University of Singapore , 9 Engineering Drive 1 , Singapore 117576.
Wong LM; Institute of Materials Research and Engineering (IMRE) , Agency for Science, Technology and Research (A*STAR) , Fusionopolis Way , Innovis #08-03, Singapore 138634.
Wang S; Institute of Materials Research and Engineering (IMRE) , Agency for Science, Technology and Research (A*STAR) , Fusionopolis Way , Innovis #08-03, Singapore 138634.
Zeng K; Department of Mechanical Engineering , National University of Singapore , 9 Engineering Drive 1 , Singapore 117576.

ACS Appl Mater Interfaces ; 10(9): 8092-8101, 2018 Mar 07.

Article em En | MEDLINE | ID: mdl-29424523

Palavras-chave

Kelvin probe force microscopy; conductive AFM; electrochemical strain microscopy; filament; first-order reversal curve; interface; scanning probe microscopy

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article