<i>In Situ</i> Time-Resolved Attenuated Total Reflectance Infrared Spectroscopy for Probing Metal-Organic Framework Thin Film Growth.

In Situ Time-Resolved Attenuated Total Reflectance Infrared Spectroscopy for Probing Metal-Organic Framework Thin Film Growth.

Zhao, Junjie; Kalanyan, Berc; Barton, Heather F; Sperling, Brent A; Parsons, Gregory N.

Afiliação

Zhao J; Department of Chemical & Biomolecular Engineering, North Carolina State University, 911 Partners Way Campus Box 7905, Raleigh, NC 27695, United States.
Kalanyan B; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Barton HF; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.
Sperling BA; Department of Chemical & Biomolecular Engineering, North Carolina State University, 911 Partners Way Campus Box 7905, Raleigh, NC 27695, United States.
Parsons GN; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, United States.

Chem Mater ; 29(20): 8804-8810, 2017 Oct 24.

Article em En | MEDLINE | ID: mdl-29545675

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article