The fractional Fourier transform as a simulation tool for lens-based X-ray microscopy.

Pedersen, Anders Filsøe; Simons, Hugh; Detlefs, Carsten; Poulsen, Henning Friis.

Afiliação

Pedersen AF; Department of Physics, Technical University of Denmark, Fysikvej 307, Kgs Lyngby 2800, Denmark.
Simons H; Department of Physics, Technical University of Denmark, Fysikvej 307, Kgs Lyngby 2800, Denmark.
Detlefs C; European Synchrotron Radiation Facility, 71 Avenue des Martyrs, 38000 Grenoble, France.
Poulsen HF; Department of Physics, Technical University of Denmark, Fysikvej 307, Kgs Lyngby 2800, Denmark.

J Synchrotron Radiat ; 25(Pt 3): 717-728, 2018 May 01.

Article em En | MEDLINE | ID: mdl-29714181