Cr/C Reflective Multilayer for Wavelength of 44.8 Å.

Zhu, Jingtao; Chen, Jinwen; Li, Haochuan; Zhang, Jiayi; Cui, Mingqi.

Afiliação

Zhu J; Ministry of Education Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Chen J; Ministry of Education Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Li H; Ministry of Education Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Zhang J; Ministry of Education Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China.
Cui M; Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Science, Beijing 100049, China.

J Nanosci Nanotechnol ; 19(1): 609-612, 2019 Jan 01.

Article em En | MEDLINE | ID: mdl-30327076

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article