Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperature.

Hettler, Simon; Onoda, Jo; Wolkow, Robert; Pitters, Jason; Malac, Marek.

Afiliação

Hettler S; Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Engesserstrasse 7, Karlsruhe 76131, Germany. Electronic address: simon.hettler@kit.edu.
Onoda J; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada.
Wolkow R; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada.
Pitters J; Nanotechnology Research Centre, National Research Council, 11421 Drive, Edmonton, Saskatchewan T6G 2M9, Canada.
Malac M; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada; Nanotechnology Research Centre, National Research Council, 11421 Drive, Edmonton, Saskatchewan T6G 2M9, Canada.

Ultramicroscopy ; 196: 161-166, 2019 01.

Article em En | MEDLINE | ID: mdl-30412841