A boosted decision tree approach to shadow detection in scanning electron microscope (SEM) images for machine vision applications.

Yan, Shang; Adegbule, Aderonke; Kibbey, Tohren C G.

Afiliação

Yan S; School of Civil Engineering and Environmental Science, University of Oklahoma, 202 W. Boyd St., Rm. 334, Norman, OK 73019, United States.
Adegbule A; School of Civil Engineering and Environmental Science, University of Oklahoma, 202 W. Boyd St., Rm. 334, Norman, OK 73019, United States.
Kibbey TCG; School of Civil Engineering and Environmental Science, University of Oklahoma, 202 W. Boyd St., Rm. 334, Norman, OK 73019, United States. Electronic address: kibbey@ou.edu.

Ultramicroscopy ; 197: 122-128, 2019 02.

Article em En | MEDLINE | ID: mdl-30597406

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article