Conduction mechanisms and voltage drop during field electron emission from diamond needles.

Torresin, Olivier; Borz, Mario; Mauchain, Julien; Blum, Ivan; Kleshch, Victor I; Obraztsov, Alexander N; Vella, Angela; Chalopin, Benoit.

Afiliação

Torresin O; Laboratoire Collisions Agrégats Réactivité, Université de Toulouse, UPS, CNRS, France.
Borz M; Groupe de Physique des Matériaux, Université de Rouen, INSA Rouen, CNRS, France.
Mauchain J; Laboratoire Collisions Agrégats Réactivité, Université de Toulouse, UPS, CNRS, France.
Blum I; Groupe de Physique des Matériaux, Université de Rouen, INSA Rouen, CNRS, France.
Kleshch VI; Department of Physics, M.V. Lomonosov Moscow State University, Russia.
Obraztsov AN; Department of Physics, M.V. Lomonosov Moscow State University, Russia; Department of Physics and Mathematics, University of Eastern Finland, Finland.
Vella A; Department of Physics, M.V. Lomonosov Moscow State University, Russia.
Chalopin B; Laboratoire Collisions Agrégats Réactivité, Université de Toulouse, UPS, CNRS, France. Electronic address: benoit.chalopin@irsamc.ups-tlse.fr.

Ultramicroscopy ; 202: 51-56, 2019 Jul.

Article em En | MEDLINE | ID: mdl-30959241