Microstructural Characterization of GaN Grown on SiC.

Saha, Sabyasachi; Kumar, Deepak; Sharma, Chandan K; Singh, Vikash K; Channagiri, Samartha; Sridhara Rao, Duggi V.

Afiliação

Saha S; Defence Metallurgical Research Laboratory, PO Kanchanbagh, Hyderabad 500058, India.
Kumar D; Defence Metallurgical Research Laboratory, PO Kanchanbagh, Hyderabad 500058, India.
Sharma CK; Defence Metallurgical Research Laboratory, PO Kanchanbagh, Hyderabad 500058, India.
Singh VK; Solid State Physics Laboratory, Timarpur, Lucknow Road, Delhi 110054, India.
Channagiri S; Advanced Facility for Microscopy and Microanalysis, Indian Institute of Science, Bangalore 560012, India.
Sridhara Rao DV; Defence Metallurgical Research Laboratory, PO Kanchanbagh, Hyderabad 500058, India.

Microsc Microanal ; 25(6): 1383-1393, 2019 12.

Article em En | MEDLINE | ID: mdl-31368426