A Novel Resistive Switching Identification Method through Relaxation Characteristics for Sneak-path-constrained Selectorless RRAM application.

Chen, Ying-Chen; Lin, Chao-Cheng; Hu, Szu-Tung; Lin, Chih-Yang; Fowler, Burt; Lee, Jack.

Afiliação

Chen YC; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, 78758, USA. yingchenchen@utexas.edu.
Lin CC; Taiwan Semiconductor Research Institute, TSRI, Hsinchu, Taiwan.
Hu ST; Material Science and Engineering Program, The University of Texas at Austin, Austin, TX, 78712, USA.
Lin CY; Department of Physics, National Sun Yat-Sen University, Kaohsiung, Taiwan.
Fowler B; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, 78758, USA.
Lee J; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX, 78758, USA.

Sci Rep ; 9(1): 12420, 2019 08 27.

Article em En | MEDLINE | ID: mdl-31455881

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2019 Tipo de documento: Article