Nano-photocurrent Mapping of Local Electronic Structure in Twisted Bilayer Graphene.

Sunku, Sai S; McLeod, Alexander S; Stauber, Tobias; Yoo, Hyobin; Halbertal, Dorri; Ni, Guangxin; Sternbach, Aaron; Jiang, Bor-Yuan; Taniguchi, Takashi; Watanabe, Kenji; Kim, Philip; Fogler, Michael M; Basov, D N

Sunku, Sai S; McLeod, Alexander S; Stauber, Tobias; Yoo, Hyobin; Halbertal, Dorri; Ni, Guangxin; Sternbach, Aaron; Jiang, Bor-Yuan; Taniguchi, Takashi; Watanabe, Kenji; Kim, Philip; Fogler, Michael M; Basov, D N.

Afiliação

Sunku SS; Department of Physics, Columbia University, New York, New York 10027-6902, United States.
McLeod AS; Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027-6902, United States.
Stauber T; Department of Physics, Columbia University, New York, New York 10027-6902, United States.
Yoo H; Departamento de Teoría y Simulación de Materiales, Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid 28049, Spain.
Halbertal D; Department of Physics, Harvard University, Cambridge, Massachusetts 02138, United States.
Ni G; Department of Physics, Columbia University, New York, New York 10027-6902, United States.
Sternbach A; Department of Physics, Columbia University, New York, New York 10027-6902, United States.
Jiang BY; Department of Physics, Columbia University, New York, New York 10027-6902, United States.
Taniguchi T; Department of Physics, UC San Diego, La Jolla, California 92093, United States.
Watanabe K; National Institute for Materials Science, Tsukuba 305-0044, Japan.
Kim P; National Institute for Materials Science, Tsukuba 305-0044, Japan.
Fogler MM; Department of Physics, Harvard University, Cambridge, Massachusetts 02138, United States.
Basov DN; Department of Physics, UC San Diego, La Jolla, California 92093, United States.