Reliable Evaluation of the Lateral Resolution of a Confocal Raman Microscope by Using the Tungsten-dot Array Certified Reference Material.

Itoh, Nobuyasu; Hanari, Nobuyasu.

Afiliação

Itoh N; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8563, Japan. nobuyasu-itoh@aist.go.jp.
Hanari N; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8563, Japan.

Anal Sci ; 36(8): 1009-1013, 2020 Aug 10.

Article em En | MEDLINE | ID: mdl-32201408