Near-Field to Far-Field RCS Prediction on Arbitrary Scanning Surfaces Based on Spherical Wave Expansion.

Kim, Woobin; Im, Hyeong-Rae; Noh, Yeong-Hoon; Hong, Ic-Pyo; Tae, Hyun-Sung; Kim, Jeong-Kyu; Yook, Jong-Gwan.

Afiliação

Kim W; Department of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Korea.
Im HR; Department of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Korea.
Noh YH; Department of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Korea.
Hong IP; Department of Information and Communication Engineering, Kongju National University, Cheonan 31080, Korea.
Tae HS; Aerospace Technology Research Institute, Agency for Defense and Development (ADD), Seosan, Chungnam 32024, Korea.
Kim JK; Aerospace Technology Research Institute, Agency for Defense and Development (ADD), Seosan, Chungnam 32024, Korea.
Yook JG; Department of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Korea.

Sensors (Basel) ; 20(24)2020 Dec 16.

Article em En | MEDLINE | ID: mdl-33339107