High-resolution measurement of atomic force microscope cantilever resonance frequency.

Xu, Bowen; Saygin, Verda; Brown, Keith A; Andersson, Sean B.

Afiliação

Xu B; Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.
Saygin V; Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.
Brown KA; Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.
Andersson SB; Department of Mechanical Engineering, Boston University, Boston, Massachusetts 02215, USA.

Rev Sci Instrum ; 91(12): 123705, 2020 Dec 01.

Article em En | MEDLINE | ID: mdl-33379947

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article