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Use of nanostructured alumina thin films in multilayer anti-reflective coatings.
Reuna, Jarno; Aho, Arto; Isoaho, Riku; Raappana, Marianna; Aho, Timo; Anttola, Elina; Hietalahti, Arttu; Tukiainen, Antti; Guina, Mircea.
Afiliação
  • Reuna J; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Aho A; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Isoaho R; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Raappana M; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Aho T; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Anttola E; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Hietalahti A; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Tukiainen A; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
  • Guina M; Optoelectronics Research Centre, Physics Unit, Faculty of Engineering and Natural Sciences, Tampere University, PO Box 692, FIN-33014 Tampere, Finland.
Nanotechnology ; 32(21)2021 Mar 05.
Article em En | MEDLINE | ID: mdl-33596557
ABSTRACT
A new method for modification of planar multilayer structures to create nanostructured aluminum oxide anti-reflection coatings is reported. The method is non-toxic and low-cost, being based on treatment of the coating with heated de-ionized water after the deposition of aluminum oxide. The results show that the method provides a viable alternative for attaining a low reflectance ARC. In particular, a low average reflectivity of ∼3.3% is demonstrated in a broadband spectrum extending from 400 nm to 2000 nm for ARCs deposited on GaInP solar-cells, the typical material used as top-junction in solar cell tandem architectures. Moreover, the process is compatible with volume manufacturing technologies used in photovoltaics, such as ion beam sputtering and electron beam evaporation.
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article