Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations.

Marks, Samuel D; Quan, Peiyu; Liu, Rui; Highland, Matthew J; Zhou, Hua; Kuech, Thomas F; Stephenson, G Brian; Evans, Paul G.

Afiliação

Marks SD; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Quan P; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Liu R; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Highland MJ; X-ray Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA.
Zhou H; X-ray Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA.
Kuech TF; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.
Stephenson GB; Materials Science Division, Argonne National Laboratory, Lemont, Illinois 60439, USA.
Evans PG; Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.

Rev Sci Instrum ; 92(2): 023908, 2021 Feb 01.

Article em En | MEDLINE | ID: mdl-33648142

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article